The ABI LinearMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The LinearMaster is designed for testing analogue ICs with up to 16 pins through a ZIF socket (see ChipMaster for digital devices). A range of adapters is also available for SOIC and PLCC devices. The ABI ChipMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The ChipMaster is designed for testing digital ICs with up to 40 pins through a ZIF socket (see LinearMaster for analogue devices). A range of adapters is also available for SOIC and PLCC devices. The ChipMaster includes a search facility for unknown ICs, loop modes for intermittent failure detection, diagnostic . major digital IC testers. The GUTB feature such as built in ''auto search test'' speeds to identify and test IC. In addition, the ''loop'' design for continuously testing function is intelligently applied to detect defective ICs and their stability. All these strengths provide significantly conveniences for .
It can test more than + ICs; Tests a wide range of Digital IC's such as 74 Series, 40/45 Series ICs ; It can test Micro- processor , , Z80, Peripherals like , , , , , , , , , , Seven segment display of common cathode common anode type. The ABI ChipMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The ChipMaster is designed for testing digital ICs with up to 40 pins through a ZIF socket (see LinearMaster for analogue devices). A range of adapters is also available for SOIC and PLCC devices. The ChipMaster includes a search facility for unknown ICs. Single - execute a single test on the IC in the socket. Loop - execute test repeatedly, regardless of the result. P Loop - execute test repeatedly, provided the result was PASS.
analogue and digital fault- finding. Together with. Windows, it becomes the ultimate test station. Short Locator. IC Tester. Digital V-I Test. The ABI BoardMaster PLUS universal diagnostic system is a uniquely Digital and analogue V-I test; Analogue matrix V-I; Digital IC identifier. ABI provides globally recognized solutions for most sectors, including: the ability to functionally test all common digital ICs in and out-of-circuit.
0コメント